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For size 00 BEEM® capsules
Electrical Resistance through adhesive: 0
the supploed sample modulus is nominal and may change with sample aging
This quartz material is well documented and used in many microscopy applications
This cycle can be repeated over and over again
SiNi 120mm For size 00 BEEM® capsulesSilicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge
