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high purity GE124 quartz
Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17
35 or 50nm Silicon Nitride Support Film
1 pack of 6 glass slides
Gold Sample
Multi75DLC Pin Mount SEM Specimen Holders high purity GE124 quartzDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius
