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For the highest resolution SSRM measurements
Note: inset shows tip cross-section
025Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 1 - 2 Cantilever Thickness (RNG): 3
Pt and Pd substrates are deposited on gold TEM grids compatible with electrochemical processes
Can be used in water as long as there are no chemicals present which would react with the substrate or the Co particles
Carbon Mount, Hitachi, Int. Thread (M4), 15mm dia. Unit:pkg/100 For the highest resolution SSRMDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard
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